Common failure analysis technolog

Material component analysis

Microscopic Fourier transform infrared spectrum analysis(FTIR)

Microscopic confocal Raman spectrometer(Raman)

Scanning electron microscopy and energy spectrum analysis(SEM/EDS)

X-ray fluorescence spectrum analysis(XRF)

Gas chromatography - mass spectrometry instrument(GC-MS)

Pyrolysis gas chromatography - mass spectrometry(PGC-MS)

Nuclear magnetic resonance analysis(NMR)

Auger electron energy spectrum analysis(AES)

X-ray photoelectron spectroscopy analysis(XPS)

X-ray diffractometer(XRD)

Time-of-flight secondary ion mass spectrometry(TOF-SIMS)

Material performance

The breakdown voltage, voltage resistance, dielectric constant, electric migration, etc

Destructive test:

Dyeing and penetration testing

Cross section analysis, metallographic cross section analysis, sample preparation of focused ion beam (FIB)  , sample preparation of ion milling (CP) .

Material physical properties testing:

The tensile strength, bending strength, etc

Failure emersion/verification